Abstract
Determination of the complex permittivity of materials via transmission/reflection measurement in rectangular waveguides is formulated as an inverse scattering problem. The presented approach is directly applicable to measurements performed with various sample sizes and orientations. The predicted results are compared with measurements and good agreement is obtained.
Original language | English |
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Pages (from-to) | 677-680 |
Number of pages | 4 |
Journal | AEU - International Journal of Electronics and Communications |
Volume | 60 |
Issue number | 9 |
DOIs | |
Publication status | Published - 2 Oct 2006 |
Funding
This work was supported by The Scientific and Technical Research Council of Turkey.
Funders | Funder number |
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Türkiye Bilimsel ve Teknolojik Araştirma Kurumu |
Keywords
- Complex permittivity measurement
- Scattering from dielectric obstacles in rectangular waveguides