Detecting and locating dielectric objects buried under a rough interface

Yasemin Altuncu; Ibrahim Akduman; Ali Yapar

doi:10.1109/LGRS.2007.890550

Detecting and locating dielectric objects buried under a rough interface

Yasemin Altuncu^*, Ibrahim Akduman, Ali Yapar

^*Corresponding author for this work

Department of Electronics and Communication Engineering

Research output: Contribution to journal › Article › peer-review

27 Citations (Scopus)

Abstract

We present a method to detect and locate dielectric objects buried under a rough surface. The method is based on the determination of appearing surface impedance of the half-space, where the dielectric objects are located. The equivalent surface impedance is obtained directly from the impedance boundary condition, which requires the knowledge of the electric field and its normal derivative on the surface. These field values are obtained by measuring the far-field data and using single-layer-potential representation of the scattered field. Using the equivalent surface impedance, one can detect and locate the buried objects. The efficiency and efficacy of the method are tested via numerical simulations.

Original language	English
Pages (from-to)	251-255
Number of pages	5
Journal	IEEE Geoscience and Remote Sensing Letters
Volume	4
Issue number	2
DOIs	https://doi.org/10.1109/LGRS.2007.890550
Publication status	Published - Apr 2007

Funding

Manuscript received August 23, 2006; revised October 30, 2006. This work was supported by the Turkish Scientific and Technological Research Council under Grant 105E029. The authors are with the Istanbul Technical University, Electrical and Electronics Engineering Faculty, 34469 Maslak, Istanbul, Turkey. Digital Object Identifier 10.1109/LGRS.2007.890550

Funders	Funder number
Consejo Nacional para Investigaciones Científicas y Tecnológicas	105E029

Keywords

Detecting and locating
Single-layer potential
Surface impedance

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10.1109/LGRS.2007.890550

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AB - We present a method to detect and locate dielectric objects buried under a rough surface. The method is based on the determination of appearing surface impedance of the half-space, where the dielectric objects are located. The equivalent surface impedance is obtained directly from the impedance boundary condition, which requires the knowledge of the electric field and its normal derivative on the surface. These field values are obtained by measuring the far-field data and using single-layer-potential representation of the scattered field. Using the equivalent surface impedance, one can detect and locate the buried objects. The efficiency and efficacy of the method are tested via numerical simulations.

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Detecting and locating dielectric objects buried under a rough interface

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