Design of an embedded system for automatically determination of the varieties of wheat seeds grown in Turkey based on image analysis

Sercan Aygun, Bilgi Gorkem Yazgac, Murvet Kirci, Ece Olcay Gunes

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

Use of certified seeds, increases the quality and quantity of yield. Typically, for the certification, the analysis and classification process is made by experts using visual characteristics of the seeds. These conventional methods are very time consuming, very tedious, costly, and depend on the person. In the determination of the seed properties process, first, identification of the seed types, varieties and identification of diseased and structural deformed seeds operations are performed. Wheat is one of the world's most important grains, as well as being the main source of food is an important industrial raw material. There are many works in the literature about determination of varieties of wheat seeds. Also, it is very important to confirm the variety of the wheat before planting. Because each variety needs its own condition for taking good yield. Previous work of our research group was based on classification of seed images by using image analysis in the computer environment. Classification of images has been a keep-up-to date method for recent years. Same like images that have close textures and colors are to be classified using some scientific approaches via image processing techniques. Depending on our previous work, same approach that run on MATLAB is to be realized in an embedded system which is independent from the computer. This Linux running embedded card stores data to be classified in an external memory. Classification algorithm is constructed by using Linux based image processing libraries. Rest of the paper is going to introduce scientific methods to classify images together with literature review. After, algorithmic details and some results are going to be presented related to system performance metrics and accuracy rates of algorithm based on computer-free embedded card.

Original languageEnglish
Title of host publication2016 5th International Conference on Agro-Geoinformatics, Agro-Geoinformatics 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509023509
DOIs
Publication statusPublished - 26 Sept 2016
Event5th International Conference on Agro-Geoinformatics, Agro-Geoinformatics 2016 - Tianjin, China
Duration: 18 Jul 201620 Jul 2016

Publication series

Name2016 5th International Conference on Agro-Geoinformatics, Agro-Geoinformatics 2016

Conference

Conference5th International Conference on Agro-Geoinformatics, Agro-Geoinformatics 2016
Country/TerritoryChina
CityTianjin
Period18/07/1620/07/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

Keywords

  • embedded systems
  • GLCM
  • image analysis
  • k-Nearest Neighbor classifier
  • Local Binary Pattern
  • wheat seed varieties

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