Abstract
Embedded microprocessors are widely used in most of the safety critical digital system applications. A fault in a single bit in the microprocessors may cause soft errors. It has different affects on the program outcome whether the fault changes a situation in the application. In order to analyse the behaviour of the applications under the faulty conditions we have designed a custom verification system. The verification system has two parts as Field Programmable Gate Array (FPGA) and personnel computer (PC). We have modified Natalius open source microprocessor in order to inject stuck-at-faults into it. We have handled a fault injection method and leveraged it to increase randomness. On FPGA, we have implemented modified Natalius microprocessor, the fault injection method and the communication protocol. Then the 'Most Significant Bit First Multiplication Algorithm' has been implemented on the microprocessor as an application. We have prepared an environment which sends inputs to and gets outputs from the Natalius microprocessor on PC part. Finally, we have analysed our application by injecting faults in specific location and random location in register file to make some classifications for effects of the injected faults.
Original language | English |
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Title of host publication | 2015 3rd International Conference on Technological Advances in Electrical, Electronics and Computer Engineering, TAEECE 2015 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 256-261 |
Number of pages | 6 |
ISBN (Electronic) | 9781479956807 |
DOIs | |
Publication status | Published - 26 May 2015 |
Event | 2015 3rd International Conference on Technological Advances in Electrical, Electronics and Computer Engineering, TAEECE 2015 - Beirut, Lebanon Duration: 29 Apr 2015 → 1 May 2015 |
Publication series
Name | 2015 3rd International Conference on Technological Advances in Electrical, Electronics and Computer Engineering, TAEECE 2015 |
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Conference
Conference | 2015 3rd International Conference on Technological Advances in Electrical, Electronics and Computer Engineering, TAEECE 2015 |
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Country/Territory | Lebanon |
City | Beirut |
Period | 29/04/15 → 1/05/15 |
Bibliographical note
Publisher Copyright:© 2015 IEEE.
Keywords
- Analysis
- Design
- Fault Injection
- Microprocessor