Derin Öǧrenme ile Termal Kameralarda Görüş Açisi Kestirimi

Translated title of the contribution: Field of View Estimation in Thermal Cameras with Deep Learning

Berkan Unutmaz, Isin Erer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this study, a deep learning-based method is proposed to automate the field of view of the camera measurement process, which is applied to each camera coming out of the mass production line and currently performed with the human eye. This proposed method is fundamentally based on detecting the time instants when a certain target enters and exits the scene seen by the camera. To be detected these moments, improved YOLOv3 with ResNet50 hybrid architecture is proposed. It is aimed to create a target detection model with less training data. With this model, the camera field of view is estimated. By using two different test systems and two different thermal cameras, a dataset is created to be used in the training processes of the proposed hybrid architecture, Faster-RCNN, and YOLOv3 target detection architectures. In the performed camera field of view estimation tests using this dataset, it is seen that the proposed hybrid architecture has higher accuracy than other target detection architectures.

Translated title of the contributionField of View Estimation in Thermal Cameras with Deep Learning
Original languageTurkish
Title of host publication2022 30th Signal Processing and Communications Applications Conference, SIU 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665450928
DOIs
Publication statusPublished - 2022
Event30th Signal Processing and Communications Applications Conference, SIU 2022 - Safranbolu, Turkey
Duration: 15 May 202218 May 2022

Publication series

Name2022 30th Signal Processing and Communications Applications Conference, SIU 2022

Conference

Conference30th Signal Processing and Communications Applications Conference, SIU 2022
Country/TerritoryTurkey
CitySafranbolu
Period15/05/2218/05/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

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