TY - GEN
T1 - Computing with nano-crossbar arrays
T2 - 20th Design, Automation and Test in Europe, DATE 2017
AU - Altun, Mustafa
AU - Ciriani, Valentina
AU - Tahoori, Mehdi
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/5/11
Y1 - 2017/5/11
N2 - Nano-crossbar arrays have emerged as a strong candidate technology to replace CMOS in near future. They are regular and dense structures, and can be fabricated such that each crosspoint can be used as a conventional electronic component such as a diode, a FET, or a switch. This is a unique opportunity that allows us to integrate well developed conventional circuit design techniques into nano-crossbar arrays. Motivated by this, our project aims to develop a complete synthesis and performance optimization methodology for switching nano-crossbar arrays that leads to the design and construction of an emerging nanocomputer. First two work packages of the project are presented in this paper. These packages are on logic synthesis that aims to implement Boolean functions with nano-crossbar arrays with area optimization, and fault tolerance that aims to provide a full methodology in the presence of high fault densities and extreme parametric variations in nano-crossbar architectures.
AB - Nano-crossbar arrays have emerged as a strong candidate technology to replace CMOS in near future. They are regular and dense structures, and can be fabricated such that each crosspoint can be used as a conventional electronic component such as a diode, a FET, or a switch. This is a unique opportunity that allows us to integrate well developed conventional circuit design techniques into nano-crossbar arrays. Motivated by this, our project aims to develop a complete synthesis and performance optimization methodology for switching nano-crossbar arrays that leads to the design and construction of an emerging nanocomputer. First two work packages of the project are presented in this paper. These packages are on logic synthesis that aims to implement Boolean functions with nano-crossbar arrays with area optimization, and fault tolerance that aims to provide a full methodology in the presence of high fault densities and extreme parametric variations in nano-crossbar architectures.
UR - http://www.scopus.com/inward/record.url?scp=85020189201&partnerID=8YFLogxK
U2 - 10.23919/DATE.2017.7926998
DO - 10.23919/DATE.2017.7926998
M3 - Conference contribution
AN - SCOPUS:85020189201
T3 - Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
SP - 278
EP - 281
BT - Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 27 March 2017 through 31 March 2017
ER -