Characterization of fiber/matrix interfaces using X-ray microtopography

Jay C. Hanan, C. Can Aydiner, Ersan Üstündag*, Geoffrey A. Swift, Steffen K. Kaldor, I. Cevdet Noyan

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

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Keyphrases

Engineering

Material Science