Characterization of fiber/matrix interfaces using X-ray microtopography

Jay C. Hanan, C. Can Aydiner, Ersan Üstündag*, Geoffrey A. Swift, Steffen K. Kaldor, I. Cevdet Noyan

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

Abstract

The structure and strength of fiber/matrix interfaces in fiber-reinforced composites are crucial in determining the overall mechanical behavior of these materials. To investigate the integrity and structure of such an interface on the microstructure scale, a model composite consisting of a single crystal Al2O3 fiber in an Al matrix was investigated with X-ray microdiffraction. The intensity of the (30.0) and (22.0) reflections of Al2O3 was monitored in topography mode using an X-ray beam focused by a tapered capillary to spot sizes ranging from 5 to 25 μm. Significant changes in this intensity revealed buried voids along a nominally intact interface. These changes also provided information about the distribution of residual stresses along the interface. The discussion includes advantages and some complications with this technique for measuring residual stresses in composites.

Original languageEnglish
Pages (from-to)919-924
Number of pages6
JournalMaterials Science Forum
Volume404-407
DOIs
Publication statusPublished - 2002
Externally publishedYes
EventProceedings of the 6th European Conference on Residual Stresses - Coimbra, Portugal
Duration: 10 Jul 200212 Jul 2002

Keywords

  • Al-AlO composite
  • Metal matrix composites
  • Thermal residual stress
  • Topography
  • X-ray diffraction

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