Characterization of a hybrid nanowire-MEMS force sensor using direct actuation

  • Bartosz Pruchnik
  • , Krzysztof Kwoka*
  • , Tomasz Piasecki
  • , Masoud Jedari Ghourichaei
  • , Umut Kerimzade
  • , Onur Aydin
  • , Bekir Aksoy
  • , Cemal Aydogan
  • , Gokhan Nadar
  • , Ivo W. Rangelow
  • , Arda Deniz Yalcinkaya
  • , Halil Bayraktar
  • , Burhanettin Erdem Alaca
  • , Teodor Gotszalk
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

In this study, we describe a process of characterization of a 3-axial force sensor with piezoresistive silicon nanowires. We present a unique method for determining the gauge factor (GF) of a volumetric structure with a stiffness exceeding 105N m−1 and resonant frequencies above 10 MHz. We employed an uncommon Lab-in-Scanning Electron Microscope (Lab-in-SEM, LIS) approach to perform a full characterization schedule under vacuum conditions using direct actuation with nanomanipulators. We discuss the force evaluation errors arising from the sample support stiffness. Finally, we present the results of GF measurements of the multi-axially investigated device with GF of over 20 for axial and over 40 for transverse loading.

Original languageEnglish
Article number075024
JournalMeasurement Science and Technology
Volume36
Issue number7
DOIs
Publication statusPublished - 31 Jul 2025

Bibliographical note

Publisher Copyright:
© 2025 The Author(s). Published by IOP Publishing Ltd.

Keywords

  • Lab-in-SEM
  • LiS
  • MEMS
  • SiNW
  • actuation
  • nanowire
  • sensors

Fingerprint

Dive into the research topics of 'Characterization of a hybrid nanowire-MEMS force sensor using direct actuation'. Together they form a unique fingerprint.

Cite this