Abstract
In this study, we describe a process of characterization of a 3-axial force sensor with piezoresistive silicon nanowires. We present a unique method for determining the gauge factor (GF) of a volumetric structure with a stiffness exceeding 105N m−1 and resonant frequencies above 10 MHz. We employed an uncommon Lab-in-Scanning Electron Microscope (Lab-in-SEM, LIS) approach to perform a full characterization schedule under vacuum conditions using direct actuation with nanomanipulators. We discuss the force evaluation errors arising from the sample support stiffness. Finally, we present the results of GF measurements of the multi-axially investigated device with GF of over 20 for axial and over 40 for transverse loading.
| Original language | English |
|---|---|
| Article number | 075024 |
| Journal | Measurement Science and Technology |
| Volume | 36 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 31 Jul 2025 |
Bibliographical note
Publisher Copyright:© 2025 The Author(s). Published by IOP Publishing Ltd.
Keywords
- Lab-in-SEM
- LiS
- MEMS
- SiNW
- actuation
- nanowire
- sensors
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