Calculating Path Loss for Stratospheric Channels During High Solar Activity

Bensu Elmaci Gökmen*, Funda Akleman, Güneş Karabulut Kurt

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Beginning with the development of 6th generation (6G) networks, it is widely accepted that high-speed and wide coverage communications, which have been targeted for many years, will be achieved through the development and deployment of High Altitude Platform Station (HAPS) systems. In this study, we investigate the effect of high solar activity on HAPS to Low Earth Orbit (LEO) satellite channel models. Considering the effects of high solar activity on the attenuation of electromagnetic waves propagating through the ionosphere of HAPS-LEO satellite channels, it is expected that these effects may be non-negligible. This study presents comparative results of path loss analyses for high and low solar activity using the same model. A mathematical expression for the loss through the ionosphere is written using the Appleton-Hartree model. The effects of electron density and collision frequency on path loss are analyzed. Comprehensive numerical results are provided for specified frequency bands.

Original languageEnglish
Title of host publication14th International Conference on Electrical and Electronics Engineering, ELECO 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350360493
DOIs
Publication statusPublished - 2023
Event14th International Conference on Electrical and Electronics Engineering, ELECO 2023 - Virtual, Bursa, Turkey
Duration: 30 Nov 20232 Dec 2023

Publication series

Name14th International Conference on Electrical and Electronics Engineering, ELECO 2023 - Proceedings

Conference

Conference14th International Conference on Electrical and Electronics Engineering, ELECO 2023
Country/TerritoryTurkey
CityVirtual, Bursa
Period30/11/232/12/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

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