Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy

H. Özgür Özer

doi:10.1016/j.ultramic.2018.09.018

Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy

H. Özgür Özer

Department of Physics Engineering

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

We report simultaneous Force -static deflection of the cantilever-, Force Gradient and Scanning Tunneling topography images of Si(111)(7 × 7) surface using an off-resonance small amplitude non-contact atomic force microscopy technique with improved force sensitivity. The signal-to-noise ratio of the fiber interferometer used to detect the deflections of the cantilever was improved by applying an RF-modulation into the diode laser, which suppresses the noise in the laser. The measured sensitivity of ∼20 fm/√Hz allows us to obtain atom resolved images of the surface in static deflection of the cantilever, simultaneously with the other imaging channels.

Original language	English
Pages (from-to)	54-57
Number of pages	4
Journal	Ultramicroscopy
Volume	196
DOIs	https://doi.org/10.1016/j.ultramic.2018.09.018
Publication status	Published - Jan 2019

Bibliographical note

Publisher Copyright:
© 2018 Elsevier B.V.

Keywords

Atomic Force Microscopy
Scanning Tunneling Microscopy
Simultaneous AFM/STM, Si(111) surface
Static deflection

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10.1016/j.ultramic.2018.09.018

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title = "Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy",

abstract = "We report simultaneous Force -static deflection of the cantilever-, Force Gradient and Scanning Tunneling topography images of Si(111)(7 × 7) surface using an off-resonance small amplitude non-contact atomic force microscopy technique with improved force sensitivity. The signal-to-noise ratio of the fiber interferometer used to detect the deflections of the cantilever was improved by applying an RF-modulation into the diode laser, which suppresses the noise in the laser. The measured sensitivity of ∼20 fm/√Hz allows us to obtain atom resolved images of the surface in static deflection of the cantilever, simultaneously with the other imaging channels.",

keywords = "Atomic Force Microscopy, Scanning Tunneling Microscopy, Simultaneous AFM/STM, Si(111) surface, Static deflection",

author = "{{\"O}zg{\"u}r {\"O}zer}, H.",

note = "Publisher Copyright: {\textcopyright} 2018 Elsevier B.V.",

year = "2019",

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doi = "10.1016/j.ultramic.2018.09.018",

language = "English",

volume = "196",

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T1 - Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy

AU - Özgür Özer, H.

PY - 2019/1

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N2 - We report simultaneous Force -static deflection of the cantilever-, Force Gradient and Scanning Tunneling topography images of Si(111)(7 × 7) surface using an off-resonance small amplitude non-contact atomic force microscopy technique with improved force sensitivity. The signal-to-noise ratio of the fiber interferometer used to detect the deflections of the cantilever was improved by applying an RF-modulation into the diode laser, which suppresses the noise in the laser. The measured sensitivity of ∼20 fm/√Hz allows us to obtain atom resolved images of the surface in static deflection of the cantilever, simultaneously with the other imaging channels.

AB - We report simultaneous Force -static deflection of the cantilever-, Force Gradient and Scanning Tunneling topography images of Si(111)(7 × 7) surface using an off-resonance small amplitude non-contact atomic force microscopy technique with improved force sensitivity. The signal-to-noise ratio of the fiber interferometer used to detect the deflections of the cantilever was improved by applying an RF-modulation into the diode laser, which suppresses the noise in the laser. The measured sensitivity of ∼20 fm/√Hz allows us to obtain atom resolved images of the surface in static deflection of the cantilever, simultaneously with the other imaging channels.

KW - Atomic Force Microscopy

KW - Scanning Tunneling Microscopy

KW - Simultaneous AFM/STM, Si(111) surface

KW - Static deflection

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DO - 10.1016/j.ultramic.2018.09.018

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C2 - 30278318

AN - SCOPUS:85054058612

SN - 0304-3991

VL - 196

SP - 54

EP - 57

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -

Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy

Abstract

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Keywords

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