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Annealed SMC samplers for Dirichlet process mixture models

  • Yener Ulker*
  • , Bilge Gunsel
  • , Ali Taylan Cemgil
  • *Corresponding author for this work
  • Istanbul Technical University
  • Bogazici University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

In this work we propose a novel algorithm that approximates sequentially the Dirichlet Process Mixtures (DPM) model posterior. The proposed method takes advantage of the Sequential Monte Carlo (SMC) samplers framework to design an effective annealing procedure that prevents the algorithm to get trapped in a local mode. We evaluate the performance in a Bayesian density estimation problem with unknown number of components. The simulation results suggest that the proposed algorithm represents the target posterior much more accurately and provides significantly smaller Monte Carlo error when compared to particle filtering.

Original languageEnglish
Title of host publicationProceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2808-2811
Number of pages4
ISBN (Print)9780769541099
DOIs
Publication statusPublished - 2010

Publication series

NameProceedings - International Conference on Pattern Recognition
ISSN (Print)1051-4651

Keywords

  • Bayesian nonparametrics
  • Dirichlet process mixture
  • Sequential monte carlo

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