Analysis of paper and board along the cross-section by Raman microscopy

E. Pigorsch, M. Finger, G. Gärtner, S. Thiele, E. Brunner

Research output: Contribution to specialist publicationArticle

Abstract

About ten years ago, improvements in the measuring technology of Raman spectroscopy led to its development from a purely scientific method into a routine laboratory procedure. Raman spectroscopy has significant advantages over other spectroscopic measurements and is particularly suitable for chemical analysis of paper which requires high local resolution and high chemical specificity. In combination with the already widely used scanning electron microscopy (SEM), Raman microscopy can provide new insights into the chemical structure of paper and board as it has not been possible by means of the analytical methods used so far.

Original languageEnglish
Pages14-18
Number of pages5
Volume69
No.3
Specialist publicationATIP. Association Technique de L'Industrie Papetiere
Publication statusPublished - 1 Oct 2015
Externally publishedYes

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