An occlusion-resistant ellipse detection method by joining coelliptic arcs

Halil Ibrahim Cakir*, Cihan Topal, Cuneyt Akinlar

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Citations (Scopus)

Abstract

In this study, we propose an ellipse detection method which gives prospering results on occlusive cases. The method starts with detection of edge segments. Then we extract elliptical arcs by computing corners and fitting ellipse to the pixels between two consecutive corners. Once the elliptical arcs are extracted, we aim to test all possible arc subsets. However, this requires exponential complexity and runtime diverges as the number of arcs increases. To accelerate the process, arc pairing strategy is deployed by using conic properties of arcs. If any pair found to be non-coelliptic, then arc combinations including that pair are eliminated. Therefore the number of possible arcs subsets is reduced and computation time is improved. In the end, ellipse fitting is applied to remaining arc combinations to decide on final ellipses. Performance of the proposed algorithm is tested on real datasets, and better results have been obtained compare to state-of-the-art algorithms.

Original languageEnglish
Title of host publicationComputer Vision - 14th European Conference, ECCV 2016, Proceedings
EditorsBastian Leibe, Nicu Sebe, Max Welling, Jiri Matas
PublisherSpringer Verlag
Pages492-507
Number of pages16
ISBN (Print)9783319464749
DOIs
Publication statusPublished - 2016
Externally publishedYes
Event14th European Conference on Computer Vision, ECCV 2016 - Amsterdam, Netherlands
Duration: 8 Oct 201616 Oct 2016

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume9906 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference14th European Conference on Computer Vision, ECCV 2016
Country/TerritoryNetherlands
CityAmsterdam
Period8/10/1616/10/16

Bibliographical note

Publisher Copyright:
© Springer International Publishing AG 2016.

Keywords

  • Arc detection
  • Ellipse detection
  • Feature extraction
  • Hough transform

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