An imaging SIMS study on the tribological properties of boron carbide thin films

Tolga Tavsanoglu; Michel Jeandin; Okan Addemir; Okan Agirseven; Onuralp Yucel

doi:10.1002/sia.5035

An imaging SIMS study on the tribological properties of boron carbide thin films

Tolga Tavsanoglu^*, Michel Jeandin, Okan Addemir, Okan Agirseven, Onuralp Yucel

^*Corresponding author for this work

Department of Metallurgical and Materials Engineering

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

In this study, boron carbide thin films were deposited on AISI M2 grade high-speed steel substrates by plasma-enhanced DC magnetron sputtering of an 'in-house' produced boron carbide target material. Tribological properties of the coatings have been evaluated by a 'pin-on-disc' tribometer. Wear tracks on boron carbide thin films were investigated by scanning electron microscopy-energy dispersive spectroscopy, electron probe microanalysis and secondary ion mass spectrometry (SIMS) elemental ion imaging. The results of analyses provided information about the reliability of the SIMS ion imaging compared to the other investigation techniques on nano-layers and nano-sized thin films.

Original language	English
Pages (from-to)	587-591
Number of pages	5
Journal	Surface and Interface Analysis
Volume	45
Issue number	1
DOIs	https://doi.org/10.1002/sia.5035
Publication status	Published - Jan 2013

Keywords

boron carbide thin films
SIMS ion imaging
tribology
wear

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10.1002/sia.5035

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abstract = "In this study, boron carbide thin films were deposited on AISI M2 grade high-speed steel substrates by plasma-enhanced DC magnetron sputtering of an 'in-house' produced boron carbide target material. Tribological properties of the coatings have been evaluated by a 'pin-on-disc' tribometer. Wear tracks on boron carbide thin films were investigated by scanning electron microscopy-energy dispersive spectroscopy, electron probe microanalysis and secondary ion mass spectrometry (SIMS) elemental ion imaging. The results of analyses provided information about the reliability of the SIMS ion imaging compared to the other investigation techniques on nano-layers and nano-sized thin films.",

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AU - Yucel, Onuralp

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AB - In this study, boron carbide thin films were deposited on AISI M2 grade high-speed steel substrates by plasma-enhanced DC magnetron sputtering of an 'in-house' produced boron carbide target material. Tribological properties of the coatings have been evaluated by a 'pin-on-disc' tribometer. Wear tracks on boron carbide thin films were investigated by scanning electron microscopy-energy dispersive spectroscopy, electron probe microanalysis and secondary ion mass spectrometry (SIMS) elemental ion imaging. The results of analyses provided information about the reliability of the SIMS ion imaging compared to the other investigation techniques on nano-layers and nano-sized thin films.

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An imaging SIMS study on the tribological properties of boron carbide thin films

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Keywords

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