A Simulation Tool for Space Applications: RadiSPICE

Omer Yusuf Muhikanci, Kemal Ozanoglu, Engin Afacan, Mustafa Berke Yelten, Gunhan Dundar

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

This paper describes a radiation simulation tool, RadiSPICE, which has the capability of performing statistical radiation simulations, temperature sweep, and sensitivity analysis for integrated circuits prone to radiation exposure. Single Event Transient (SET) and Total Ionising Dose (TID) effects are modelled through current and voltage sources introduced to the circuit. RadiSPICE imports the circuit netlist and performs statistical radiation simulation, temperature sweep, and sensitivity analyses. Output histograms along with maximum and minimum values of extracted parameters can be probed. To demonstrate the effectiveness of the tool, two case studies are performed on a linear amplifier and a logic cell, showing that space radiation can be detrimental to electrical circuit performance. To our best knowledge, the developed tool is the first example of a well-equipped CAD tool for radiation simulation for electrical circuits.

Original languageEnglish
Title of host publicationProceedings - 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665467032
DOIs
Publication statusPublished - 2022
Event18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2022 - Villasimius, Italy
Duration: 12 Jun 202215 Jun 2022

Publication series

NameProceedings - 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2022

Conference

Conference18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2022
Country/TerritoryItaly
CityVillasimius
Period12/06/2215/06/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

Keywords

  • design for testability
  • Integrated circuit
  • Monte Carlo
  • radiation effects
  • radiation hardening
  • sensitivity
  • temperature

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