A rare event based yield estimation methodology for analog circuits

Izel Çaǧin Odabaşi, Mustafa Berke Yelten, Engin Afacan, Faik Baskaya, Ali Emre Pusane, Günhan Dündar

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Citations (Scopus)

Abstract

With the growing use of analog circuits in sensor systems for internet of things applications, estimation of their yield has become critical in order to increase the efficiency of large volume manufacturing. In this paper, a methodology to estimate the yield of analog circuits beyond 95% is proposed. The methodology is based on an algorithm that uses adaptive sampling to approach the 'tail' region of the initial distribution which contains the dysfunctional units. These units do not satisfy the initial design targets thereby lowering the yield. An inverter and a two-stage operational amplifier have been used to verify the methodology where the reference distribution is based on 106 samples for both circuits. Simulation results reveal that the accuracy for 95%, 98%, and 99% yield has been compromised by less than 2.1%, 5.7%, and 7.4%, respectively, whereas the computation cost is reduced by 20×.

Original languageEnglish
Title of host publicationProceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages33-38
Number of pages6
ISBN (Electronic)9781538657546
DOIs
Publication statusPublished - 11 Jul 2018
Event21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018 - Budapest, Hungary
Duration: 25 Apr 201827 Apr 2018

Publication series

NameProceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018

Conference

Conference21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018
Country/TerritoryHungary
CityBudapest
Period25/04/1827/04/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

  • Analog circuits
  • Parametric faults
  • Process variations
  • Rare event
  • Yield estimation

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