TY - JOUR
T1 - A new approach for parameter extraction of complex models and an application for SPICE MOSFET level-3 static model
AU - Yazgi, Metin
AU - Kuntman, Hakan
PY - 1999/2
Y1 - 1999/2
N2 - In this work, a new approach is presented for specifying the error term used in the parameter extraction algorithms. By using the new approach, it is possible to remove the differential operations in the algorithms used for the extraction of parameters in complex models. Also, we present an iteration procedure obtained by using the new approach for the extraction of SPICE level-3 MOST static model parameters KP, VTH, TETA, VMAX and RS (=RD). As well as the triode region parameters, GAMMA, NFS and KAPPA can be found in the overall procedure. Results of the procedure have been compared with the experimental results. It is obvious from this comparison that the new approach is effective for the determination of level-3 model parameters, as for the determination of parameters of proper models.
AB - In this work, a new approach is presented for specifying the error term used in the parameter extraction algorithms. By using the new approach, it is possible to remove the differential operations in the algorithms used for the extraction of parameters in complex models. Also, we present an iteration procedure obtained by using the new approach for the extraction of SPICE level-3 MOST static model parameters KP, VTH, TETA, VMAX and RS (=RD). As well as the triode region parameters, GAMMA, NFS and KAPPA can be found in the overall procedure. Results of the procedure have been compared with the experimental results. It is obvious from this comparison that the new approach is effective for the determination of level-3 model parameters, as for the determination of parameters of proper models.
UR - http://www.scopus.com/inward/record.url?scp=0033075835&partnerID=8YFLogxK
U2 - 10.1016/s0026-2692(98)00101-3
DO - 10.1016/s0026-2692(98)00101-3
M3 - Article
AN - SCOPUS:0033075835
SN - 0026-2692
VL - 30
SP - 149
EP - 155
JO - Microelectronics Journal
JF - Microelectronics Journal
IS - 2
ER -