Abstract
High energy X-ray diffraction was employed to probe the complex constitutive behavior of a polycrystalline ferroelectric material in various sample orientations. Pb(Zn,Nb)O 3-Pb(Zr,Ti)O 3 (PZN-PZT) ceramics were subjected to a cyclic bipolar electric field while diffraction patterns were taken. Using transmission geometry and a two-dimensional detector, lattice strain and texture evolution (domain switching) were measured in multiple sample directions simultaneously. In addition, texture analysis suggests that non-180° domain switching is coupled with lattice strain evolution during uniaxial electrical loading. As a result of this material's high strain anisotropy, the full-pattern Rietveld method was inadequate to analyze the diffraction data. Instead, a modified Rietveld method, which includes an elastic anisotropy term, yielded significant improvements in the data analysis results.
Original language | English |
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Pages (from-to) | 1494-1502 |
Number of pages | 9 |
Journal | Acta Materialia |
Volume | 60 |
Issue number | 4 |
DOIs | |
Publication status | Published - Feb 2012 |
Externally published | Yes |
Keywords
- Piezoelectricity
- Rietveld
- X-ray diffraction