A Microwave tomographic approach for nondestructive testing of dielectric coated metallic surfaces

Onur Mudanyai*, Selda Yidiz, Ǒguz Semerci, Ali Yapar, Ibrahim Akduman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)

Abstract

A microwave imaging method for nondestructive testing of perfectly conducting surfaces beyond a layered media is presented. The method is an adaptation of the surface reconstruction approach by Yapar et al. to the present problem. It is based on the analytical continuation of the measured data to the surface under test through a special representation of the scattered field in terms of Fourier transform and Taylor expansion. Then the problem is reduced to the solution of a nonlinear equation which is solved iteratively via the Newton method and regularization in the least squares sense. Numerical simulations show that defects as small as lambda/500 can be recovered through the presented algorithm.

Original languageEnglish
Article number4455563
Pages (from-to)180-184
Number of pages5
JournalIEEE Geoscience and Remote Sensing Letters
Volume5
Issue number2
DOIs
Publication statusPublished - Apr 2008

Funding

Manuscript received August 8, 2007. This work was supported by the TUBITAK, Turkish Scientific and Technological Research Council under the Grant 105E029. The authors are with the Electrical and Electronics Engineering Faculty, Istanbul Technical University, Istanbul 34469, Turkey. Digital Object Identifier 10.1109/LGRS.2008.915602

FundersFunder number
TUBITAK
Turkish Scientific and Technological Research Council105E029

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