A Current Calibration Circuit for a 14-Bit Column-Parallel Dual-Ramp Single-Slope ADC in Infrared Image Sensors

Omer Lutfi Nuzumlali; Tufan Coskun Karalar

doi:10.1109/TCSII.2024.3425595

A Current Calibration Circuit for a 14-Bit Column-Parallel Dual-Ramp Single-Slope ADC in Infrared Image Sensors

Omer Lutfi Nuzumlali^*, Tufan Coskun Karalar

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

This brief introduces a current calibration circuit that is specifically designed for use in a column-parallel Dual-Ramp Single-Slope (DRSS) ADC. This circuit creates two current sources with a precise current ratio. These currents are then used in coarse and fine conversion stages. The desired current ratio can be achieved by adjusting the integration times based on standard clock sources in typical CMOS circuits. A 14-bit DRSS ADC that utilizes this calibration technique has been implemented in a 0.18μ m CMOS technology to be used in an Infrared Detector (IR) Read-Out Integrated Circuit (ROIC). Experiments demonstrate that a DNL error smaller than ±0.4 LSB is successfully achieved when the current calibration circuit is active.

Original language	English
Pages (from-to)	4824-4828
Number of pages	5
Journal	IEEE Transactions on Circuits and Systems II: Express Briefs
Volume	71
Issue number	12
DOIs	https://doi.org/10.1109/TCSII.2024.3425595
Publication status	Published - 2024
Externally published	Yes

Bibliographical note

Publisher Copyright:
© 2004-2012 IEEE.

Keywords

A/D conversion
current calibration
dual ramp single slope
image sensors
infrared detectors read-out IC
on-chip calibration
two step ADC

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10.1109/TCSII.2024.3425595

Cite this

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title = "A Current Calibration Circuit for a 14-Bit Column-Parallel Dual-Ramp Single-Slope ADC in Infrared Image Sensors",

abstract = "This brief introduces a current calibration circuit that is specifically designed for use in a column-parallel Dual-Ramp Single-Slope (DRSS) ADC. This circuit creates two current sources with a precise current ratio. These currents are then used in coarse and fine conversion stages. The desired current ratio can be achieved by adjusting the integration times based on standard clock sources in typical CMOS circuits. A 14-bit DRSS ADC that utilizes this calibration technique has been implemented in a 0.18μ m CMOS technology to be used in an Infrared Detector (IR) Read-Out Integrated Circuit (ROIC). Experiments demonstrate that a DNL error smaller than ±0.4 LSB is successfully achieved when the current calibration circuit is active.",

keywords = "A/D conversion, current calibration, dual ramp single slope, image sensors, infrared detectors read-out IC, on-chip calibration, two step ADC",

author = "Nuzumlali, {Omer Lutfi} and Karalar, {Tufan Coskun}",

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PY - 2024

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AB - This brief introduces a current calibration circuit that is specifically designed for use in a column-parallel Dual-Ramp Single-Slope (DRSS) ADC. This circuit creates two current sources with a precise current ratio. These currents are then used in coarse and fine conversion stages. The desired current ratio can be achieved by adjusting the integration times based on standard clock sources in typical CMOS circuits. A 14-bit DRSS ADC that utilizes this calibration technique has been implemented in a 0.18μ m CMOS technology to be used in an Infrared Detector (IR) Read-Out Integrated Circuit (ROIC). Experiments demonstrate that a DNL error smaller than ±0.4 LSB is successfully achieved when the current calibration circuit is active.

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KW - dual ramp single slope

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KW - infrared detectors read-out IC

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A Current Calibration Circuit for a 14-Bit Column-Parallel Dual-Ramp Single-Slope ADC in Infrared Image Sensors

Abstract

Bibliographical note

Keywords

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