Project Details
| Short title | Experimental Determination of Gate-Oxide Breakdown of CMOS Transistors at Cryogenic Temperatures |
|---|---|
| Status | Finished |
| Effective start/end date | 8/06/20 → 8/06/21 |
Experimental Determination of Gate-Oxide Breakdown of CMOS Transistors at Cryogenic Temperatures
Project: Research › SRP